相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Charge trapping at the dielectric of organic transistors visualized in real time and space
Simon G. J. Mathijssen et al.
ADVANCED MATERIALS (2008)
Electrostatic force microscopy study about the hole trap in thin nitride/oxide/semiconductor structure
Jong-Hun Kim et al.
APPLIED PHYSICS LETTERS (2008)
Dynamics of threshold voltage shifts in organic and amorphous silicon field-effect transistors
Simon G. J. Mathijssen et al.
ADVANCED MATERIALS (2007)
General observation of n-type field-effect behaviour in organic semiconductors
LL Chua et al.
NATURE (2005)
Probing nanoscale dipole-dipole interactions by electric force microscopy -: art. no. 166101
T Mélin et al.
PHYSICAL REVIEW LETTERS (2004)
Conductivity of macromolecular networks measured by electrostatic force microscopy
CH Lei et al.
APPLIED PHYSICS LETTERS (2003)
Influence of mobile ions on nanotube based FET devices
K Bradley et al.
NANO LETTERS (2003)
Hysteresis caused by water molecules in carbon nanotube field-effect transistors
W Kim et al.
NANO LETTERS (2003)
High-mobility nanotube transistor memory
MS Fuhrer et al.
NANO LETTERS (2002)
Ambipolar electrical transport in semiconducting single-wall carbon nanotubes
R Martel et al.
PHYSICAL REVIEW LETTERS (2001)