期刊
APPLIED PHYSICS LETTERS
卷 93, 期 15, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.2998656
关键词
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资金
- SANDiE European Network of Excellence [NMP4-CT-2004-500101]
- Spanish MEC [TEC2005-05781-C03-02, MAT2007-60643]
- Junta de Andalucia [TEP-120, TIC-145, PAI05TEP-00383]
High angle annular dark field scanning transmission electron microscopy (HAADF-STEM) is a powerful tool to quantify size, shape, position, and composition of nano-objects with the assessment of image simulation. Due to the high computational requirements needed, nowadays it can only be applied to a few unit cells in standard computers. To overpass this limitation, a parallel software (SICSTEM) has been developed. This software can afford HAADF-STEM image simulations of nanostructures composed of several hundred thousand atoms in manageable time. The usefulness of this tool is exemplified by simulating a HAADF-STEM image of an InAs nanowire. (C) 2008 American Institute of Physics.[DOI: 10.1063/1.2998656]
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