期刊
APPLIED PHYSICS LETTERS
卷 93, 期 18, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3005423
关键词
crystal microstructure; current density; electrical conductivity; electrical resistivity; gold; nanowires; scanning electron microscopy
资金
- EPSRC, UK [GR/S85689]
- Engineering and Physical Sciences Research Council [GR/S85689/01] Funding Source: researchfish
This work presents an accurate measurement of electrical properties of individual gold nanowires, directly measured by nanomanipulators in situ in a scanning electron microscope. The electrical testing of 55 nm width gold nanowires, with a bamboo-type polycrystalline micorstructure, shows that individual gold nanowires have an ideal resistivity of about 2.26 mu Omega cm and remarkably high failure current density of 4.94x10(8) A cm(-2). The measurement of resistance (R) versus nanowire length of individual nanowires shows that the intrinsic conductivity of the gold nanowire is 4.45x10(7) Omega(-1) m(-1). There is no evidence that the polycrystalline grain structure, 55 nm width and 500-2800 nm length, generates any size-induced electrical effects. The accurate electrical testing of gold nanowires should be significant for nanodevices and nanoelectronics using them as building blocks or interconnects.
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