期刊
APPLIED PHYSICS LETTERS
卷 93, 期 7, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.2969045
关键词
-
资金
- University of Connecticut Research Foundation
- UConn Institute of Materials Science
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [0817263] Funding Source: National Science Foundation
An atomic force microscopy (AFM) based technique is described for mapping piezoactuation with nanoscale resolution in less than a second per complete image frame. High speed piezo force microscopy (HSPFM) achieves this (100) increase in acquisition rates by coupling a commercial AFM with concepts of acoustics. This allows previously inaccessible dynamic studies, including measuring ferroelectric domain nucleation and growth during in situ poling. Hundreds of consecutive images are analyzed with 49 mu s temporal resolution per pixel per frame, revealing 32 nucleation sites/mu m(2) with 36 mu m/s average domain velocities. HSPFM images acquired in as fast as 1/10th s are also presented. (C) 2008 American Institute of Physics.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据