期刊
APPLIED PHYSICS LETTERS
卷 93, 期 7, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.2968305
关键词
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资金
- EU Marie Curie TOK [MTKD-CT-2004-003178]
- DOE
We investigate the microscopic reversal behavior in perpendicular-anisotropy magnetic thin films using an integrated mask-sample design that allows probing a nanoscale sample region with soft x-rays. Local hysteresis loops and spectroholography images are obtained from the transmitted signal exploiting x-ray magnetic circular dichroism. Our data provide direct evidence of microscopic spin-flip avalanches, such as responsible for Barkhausen noise. In comparison with macroscopic magnetometry measurements we find evidence for the sputter pressure dependent introduction of local defects that prevent a continuous domain wall motion but are not strong enough to introduce the appearance of microscopic return point memory. (C) 2008 American Institute of Physics.
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