Ion bunch stacking in a Penning trap after purification in an electrostatic mirror trap

The success of many measurements in analytical mass spectrometry as well as in precision mass determinations for atomic and nuclear physics is handicapped when the ion sources deliver contaminations, i.e., unwanted ions of masses similar to those of the ions of interest. In particular, in ion-trapping devices, large amounts of contaminant ions result in significant systematic errors-if the measurements are possible at all. We present a solution for such cases: The ions from a quasi-continuous source are bunched in a linear radio-frequency-quadrupole ion trap, separated by a multi-reflection time-of-flight section followed by a Bradbury-Nielsen gate, and then captured in a Penning trap. Buffer-gas cooling is used to damp the ion motion in the latter, which allows a repeated opening of the Penning trap for a stacking of mass-selected ion bunches. Proof-of-principle demonstrations have been performed with the ISOLTRAP setup at ISOLDE/CERN, both with Cs-133(+) ions from an off-line ion source and by application to an on-line beam of Lu-179(+) ions contaminated with (DyO+)-Dy-163-O-16 ions. In addition, an optimization of the experimental procedure is given, in particular for the number of ion bunches captured as a function of the ions' lifetimes and the parameters of the experiment.