期刊
APPLIED PHYSICS B-LASERS AND OPTICS
卷 100, 期 1, 页码 151-158出版社
SPRINGER HEIDELBERG
DOI: 10.1007/s00340-010-3945-6
关键词
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We present for the first time a system and new algorithms for spectral THz-tomography. The electric field of single cycle ultra short THz-pulses can be measured time resolved in amplitude and phase. By focusing ultra short THz-pulses to a sample and analyzing the transmitted or reflected beams the inner structure of the sample can be investigated with a resolution up to 0.4 mm by evaluating the time resolved data. Thus a spectrum of every scanned THz-pulse can be calculated with the usage of the fast Fourier transform. In contrast to classical computed tomography (CT) with X-rays a higher amount of information can be obtained. Based on the characteristic absorption spectra of varying materials it is now possible to identify different substances inside a sample by terahertz-tomography with probabilities that are higher than 80%.
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