Feasibility study of the application of micro-Raman imaging as complement to micro-XRF imaging

X-ray fluorescence (XRF) spectroscopy and Raman spectroscopy are preferential analytical techniques to study cultural heritage objects, since both techniques may provide complementary information in a non-destructive manner. Moreover, the application of microscopic beams allows the investigation of heterogeneous samples on the microscopic level and the study of the heterogeneity of particular samples. The micro-XRF method became already a routine analytical imaging method also because of the well-established spectrum evaluation methodology enabling specific data handling procedures. These include multivariate statistical analysis procedures such as principal components analysis (PCA) in order to explore and describe the acquired data, and clustering techniques in order to find similar pixels (or areas) in the obtained images. In the case of the micro-Raman technique, however, the usual approach is to perform a single spot analysis of only a few selected positions in order to ultimately identify the material on the basis of the comparison with Raman spectra obtained from reference materials. However, when samples are heterogeneous, imaging is still to be preferred in order to deal with the problem of sampling. With the arrival of a new micro-Raman spectrometer at the UGent laboratories, there was the need to explore the possibilities of Raman imaging. One of the most important aspects of imaging is the time needed for the analysis. Therefore, the influence of different instrumental parameters, such as resolution (low or high) and measuring time per pixel, on the quality of Raman spectra and images was investigated in order to evaluate the possibility of performing fast Raman mappings because of the need to identify the regions of interest on the art object in a more systematic manner.