期刊
SURFACE SCIENCE
卷 576, 期 1-3, 页码 212-216出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2004.12.014
关键词
kinetic roughening; electrodeposition; amorphous films; soft magnetic properties
资金
- Engineering and Physical Sciences Research Council [GR/S29690/01] Funding Source: researchfish
We have used atomic force microscopy to measure the roughness of electrodeposited amorphous CoP as a function of length scale and film thickness. In contrast to the power law scaling usually observed for polycrystalline electrodeposited films in the absence of additives, the roughness decreases with increasing film thickness. For films grown on An on glass substrates, the characteristic lateral feature size is similar to250 nm, independent of the CoP thickness. This is consistent with columnar growth. Films of thickness 4 mum have a saturation roughness of only similar to1 nm, which is less than that of the substrates. (C) 2004 Elsevier B.V. All rights reserved.
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