期刊
IEEE TRANSACTIONS ON INFORMATION THEORY
卷 51, 期 3, 页码 1049-1062出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIT.2004.842706
关键词
continuous wavelet transform; corner detection; singularity; wavelet modulus maxima
Complex-valued wavelets are normally used to measure instantaneous frequencies, while real wavelets are normally used to detect singularities. We prove that the wavelet modulus maxima with a complex-valued wavelet can detect and characterize singularities. This is an extension of the previous wavelet work of Mallat and Hwang on modulus maxima using a real wavelet. With this extension, we can simultaneously detect instantaneous frequencies and singularities from the wavelet modulus maxima of a complex-valued wavelet. Some results of singularity detection with the modulus maxima from a real wavelet and an analytic complex-valued wavelet are compared. We also demonstrate that singularity detection methods can be employed to detect the corners of a planar object.
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