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Fabrication and characterisation of solar-blind Al0.6Ga0.41N MSM photodetectors

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ELECTRONICS LETTERS
卷 41, 期 5, 页码 274-275

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IEE-INST ELEC ENG
DOI: 10.1049/el:20048028

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Solar-blind metal-semiconductor-metal (MSM) photodiodes based on MOCVD-grown Al0.6Ga0.4N template have been fabricated and tested. AlGaN detector samples were fabricated using a microwave compatible fabrication process. Optical transmission, current-voltage, spectral responsivity, and temporal pulse response measurements were carried out. The fabricated devices had very low leakage current and displayed true solar-blind response with similar to 255 nm cutoff wavelength.

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