4.7 Article

Pattern classification by using improved wavelet Compressed Zernike Moments

期刊

APPLIED MATHEMATICS AND COMPUTATION
卷 212, 期 1, 页码 162-176

出版社

ELSEVIER SCIENCE INC
DOI: 10.1016/j.amc.2009.02.029

关键词

Pattern classification; Zernike moments; Compressed features; Feature extraction

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In this paper, an improved Feature Extraction Method (FEM), which selects discriminative feature sets able to lead to high classification rates in pattern recognition tasks, is presented. The resulted features are the wavelet coefficients of an improved compressed signal, consisting of the Zernike moments amplitudes. By applying a straightforward methodology, it is aimed to construct optimal feature vectors in the sense of vector dimensionality and information content for classification purposes. The resulting surrogate feature vector is of lower dimensionality than the original Zernike moment feature vector and thus more appropriate for pattern recognition tasks. Appropriate validation tests have been arranged, in order to investigate the performance of the proposed algorithm by measuring the discriminative power of the new feature vectors despite the information loss. (c) 2009 Elsevier Inc. All rights reserved.

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