Polarization reversal and capacitance-voltage characteristic of epitaxial Pb(Zr,Ti)O3 layers -: art. no. 192902

Capacitance-voltage (C-V) measurements were performed on epitaxial layers of PbsZr(0.2)Ti(0.8)dO(3) (PZT) with top and bottom SrRuO3 (SRO) electrodes. It is shown that the sharp capacitance peak/discontinuity which is present in the C-V characteristics at different frequencies is directly associated with the polarization reversal. The ferroelectric film is assumed as a large band-gap semiconductor with Schottky contacts at the metal-ferroelectric interfaces. The capacitance discontinuity at the reversal scoercived voltage is associated with a discontinuity in the built-in potential at the PZT/ SRO interfaces. The C-V characteristics for voltage ranges outside the coercive values can be used to extract the free carrier concentrations as in the case of Schottky metal-semiconductor contacts. The carrier concentration was found to be (2-4) x 10(18) cm(-3), independent of measuring frequency and temperature up to 1 MHz and 170 degrees C, respectively, suggesting completely ionized shallow impurities. (c) 2005 American Institute of Physics.