期刊
ADVANCED MATERIALS
卷 17, 期 10, 页码 1269-+出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adma.200401764
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Linear extrinsic defects can be embedded inside the lattice of a silica colloidal photonic-crystal film via a directed self-assembly strategy involving a combination of top-down photolithography and bottom-up colloidal assembly. High-spatial-resolution scanning micro-optical spectroscopy proves to be an effective means of characterizing the photonic crystal properties of the buried defects (see Figure) within the film.
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