期刊
APPLIED SURFACE SCIENCE
卷 244, 期 1-4, 页码 607-610出版社
ELSEVIER
DOI: 10.1016/j.apsusc.2004.10.131
关键词
pentacene; infrared spectroscopy; film structure; SiO2 surface
The thin film of pentacene on a SiO2 surface has been investigated by infrared spectroscopy in the multiple internal reflections (MIR) mode. It was found that the molecules in the monolayer are arranged with their molecular axes perpendicular to the surface, and that this arrangement is conserved during film growth up to a 70-nm thickness. In addition, the assignment of the infrared active vibrational modes is discussed. (c) 2004 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据