Charge transfer and formation of conducting C60 monolayers at C60/noble-metal interfaces -: art. no. 103716

The resistance of a conducting C-60 monolayer formed on a polycrystalline Ag film was found to be 0.7 +/- 0.1 k Omega by in situ resistance measurements. By another series of in situ resistance measurements, the surface scattering cross sections, whose magnitude represents the relative amount of transferred charge, were evaluated as 100 angstrom(2) for C-60/Au, and 150 angstrom(2) for C-60/Cu and C-60/Ag systems. However, comparison with previous results obtained for monolayers formed on Au and Cu films showed that the resistances of conducting C-60 monolayers do not show a simple dependence on the transferred charge. Atomic force microscopy measurements revealed that the grain size of the underlying noble metals also plays an important role. (c) 2005 American Institute of Physics.