4.7 Article

Reliability modeling of multi-state degraded systems with multi-competing failures and random shocks

期刊

IEEE TRANSACTIONS ON RELIABILITY
卷 54, 期 2, 页码 297-303

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2005.847278

关键词

degradation processes; degraded system reliability; multiple-failure processes; multi-state reliability; random shocks

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In this paper, we develop a generalized multi-state degraded system reliability model subject to multiple competing failure processes, including two degradation processes, and random shocks. The operating condition of the multi-state systems is characterized by a finite number of states. We also present a methodology to generate the system states when there are multi-failure processes. The model can be used not only to determine the reliability of the degraded systems in the context of multi-state functions, but also to obtain the states of the systems by calculating the system state probabilities. Several numerical examples are given to illustrate the concepts.

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