Effect of molecular weight on the exponential growth and morphology of hyaluronan/chitosan multilayers: A surface plasmon resonance spectroscopy and atomic force microscopy investigation

The layer-by-layer growth of multilayer assemblies of two polysaccharides, the polyanion hyaluronan (HA) and the polycation chitosan (CH), was investigated using atomic force microscopy (AFM) and surface plasmon resonance (SPR) spectroscopy, with primary emphasis on the effect of the polysaccharide molecular weights on the film thickness and surface morphology. The HA/CH multilayers exhibit an exponential increase of the optical film thickness with the number of deposited bilayers. We show that the multilayer thickness at a given stage depends on the size of both CH, the diffusing polyelectrolyte, and HA, the nondiffusing species. Assemblies (12 bilayers) of high molecular weight polysaccharides (HA, 360 000; CH, 160 000) were twice as thick (similar to 900 nm vs similar to 450 nm) as those obtained with low molecular weight polymers (HA, 30 000; CH, 31 000), as assessed by AFM scratch tests. The exponential growth rate is the same for the high and low molecular weight pairs; the larger film thicknesses observed by SPR and by AFM arising from an earlier onset of the steep exponential growth phase in the case of the high molecular weight pair. In all cases, isolated islets form during the deposition of the first CH layer onto the underlying HA. Upon further film growth, individual islets coalesce into larger vermiculate features. The transition from distinct islands to vermiculate structures depends on the molecular weights of the polysaccharides and the lower molecular weight construct presents larger wormlike surface domains than the high molecular weight pair.