期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
卷 44, 期 7B, 页码 5336-5338出版社
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.44.5336
关键词
carbon nanotube; metal coating; scanning tunneling microscopy/spectroscopy; Si(111)-7 x 7; Si(100)-2 x 1; multiprobe STM
By exploiting the metal coating of carbon nanotube (CNT) tips for a scanning tunneling microscope (STM), we demonstrated atomic imaging/spectroscopy and showed their potential for electrical nanoprobes. A CNT glued to a W tip was uniformly coated with a thin W layer 3-6 nm thick. Using this tip, stable atomic imaging and spectroscopy were carried out on clean Si(111)-7 x 7 and Si(100)-2 x 1 surfaces. The mechanical flexibility of the coated CNT was maintained by virtue of the thin-layer coating, enabling repeated direct contact to the sample surface. Two W-coated CNT tips were brought together within a distance of approximately 50nm. These results indicate that the tips are useful for electronic transport measurements on a nanometer scale after installation into a multiprobe STM.
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