期刊
PROCEEDINGS OF THE IEEE
卷 93, 期 7, 页码 1257-1264出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPROC.2005.851534
关键词
active matrix organic LED (AMOLED); Amorphous silicon (a-Si : H); flexible displays; mechanical stress; pixel circuit; strain gauges; thin-film transistor (TFT) backplane; threshold voltage shift
While fabrication of active matrix organic LED (AMOLED) displays on plastic substrates continues to face technological challenges, stable electrical operation of thin-film transistor (TFT) pixel circuits under mechanical stress induced by substrate bending remains a critical issue. This paper investigates strain-induced shifts in hydrogenated amorphous silicon TFT characteristics and the compound impact on TFT circuit behavior Measurements show that the magnitude of the shifts is determined by the direction of current flow in the TFT with respect to the bending stress orientation as well as bias conditions. Physically based compact models are developed that relate device characteristics to material behavior for design and optimization of AMOLED pixel circuits that can maintain immunity to bending stress. In particular current mirror-based pixel circuits are presented that compensate for the long term threshold voltage shift and instantaneous strain-induced shifts in device characteristics.
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