Long-term accelerated current operation of white light-emitting diodes

Long-term degradation tests regarding white light-emitting diodes based on InGaN were performed under accelerated current conditions, and the half-life of the light's output was estimated. An estimated mean half-life of 1.5 x 10(4) h was obtained under the recommended 20-mA operating condition. The change in the emission spectrum was found to be slight, and the color quality was considered generally satisfactory over the long term. (c) 2004 Published by Elsevier B.V.