4.4 Article Proceedings Paper

Photoelectron spectroscopy with hard X-rays

出版社

ELSEVIER
DOI: 10.1016/j.nima.2005.05.015

关键词

high-energy XPS; electronic structure; bulk properties; buried layers; electron escape depth; threshold Auger process; self-assembled monolayers; synchrotron radiation

向作者/读者索取更多资源

The use of hard X-ray synchrotron radiation as the primary excitation for photoelectron spectroscopy has recently attracted great interest. At HASYLAB, a dedicated instrument for experiments in the photon energy range 2.3-10 keV (electron energies up to 7.5 keV) has been in operation for several years. The overall energy resolution is source limited to about 0.4 eV, which is well suited for most core level studies. Scientific work using this instrument has so far focused on the near-threshold excitation of inner-shell Auger transitions and the electronic properties of buried structures and interfaces. Here, general aspects of photoelectron spectroscopy using X-rays in the keV energy regime are discussed and some applications are presented. (c) 2005 Elsevier B.V. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.4
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据