期刊
NANOTECHNOLOGY
卷 16, 期 9, 页码 1754-1760出版社
IOP PUBLISHING LTD
DOI: 10.1088/0957-4484/16/9/057
关键词
-
X-ray nanodiffraction was developed to study individual crystalline nano-objects at the Advanced Photon Source (APS). This technique allows nondestructive structural characterization of individual nano-objects with the advantages of high structural sensitivity and high penetration. Using the extremely high brightness of a third-generation synchrotron radiation source and hard x-ray phase zone-plate optics, we have focused hard x-rays to a microbeam of less than 200 nm during routine operation so that significant diffraction can be measured from a single tin oxide nanowire (cross section down to 24 nm x 10 nm). In this paper, we will describe the experimental technique in detail and present the results of a structural study of a few tin oxide nanowires.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据