期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 12, 期 -, 页码 659-664出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0909049505023216
关键词
synchrotron beamline; X-ray diffraction; high pressure
A new state-of-the art synchrotron beamline fully optimized for monochromatic X-ray diffraction at high pressure and high ( or low) temperature is presented. In comparison with the old high-pressure beamline ID30, this new beamline exhibits outstanding performance in terms of photon flux and focusing capabilities. The main components of this new instrument will be described in detail and compared with the performance of beamline ID30. In particular, the choices in terms of X-ray source, X-ray optics, sample environment and detectors are discussed. The first results of the beamline commissioning are presented.
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