期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
卷 44, 期 9B, 页码 6923-6926出版社
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.44.6923
关键词
PZT; PLZT; thin film; X-ray absorption spectroscopy (XAS); soft-X-ray emission spectroscopy (SXES); electronic structure; hybridization effect
The electronic structure of (Pb,La)(Zr,Ti)O-3 (PLZT) thin film was studied by X-ray absorption spectroscopy and soft-X-ray emission spectroscopy (SXES). The Ti 3d and O 2p partial densities of states in the valence band region were observed in O 1 s and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the O 2p state, indicating the occurrence of the hybridization effect between the Ti 3d and O 2p states. The hybridization effect of PLZT thin film is lower than that of Pb(Zr,Ti)O-3 thin film. This finding indicates that the hybridization effect is closely related to the change in the bond length between Ti and O ions.
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