期刊
OPTICS AND LASER TECHNOLOGY
卷 37, 期 7, 页码 513-523出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.optlastec.2004.08.016
关键词
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Thin films of the organic semiconductor nickel phthalocyanine (NiPc) are structurally investigated using X-ray diffraction and infrared light absorption. The optical absorption and dispersion studies of nickel phthalocyanine were investigated using spectrophotometric measurements of transmittance and reflectance at normal incidence in the wavelength range 190-2100 nm. The absorption spectra recorded in the UV-VIS region show two well-defined absorption bands of the phthacyanine molecules, namely, the Soret and the Q-band. The Davydove splitting of the main absorption peak in the metal phthalocyanines correlates with the relative tendencies of the metal to out-of-plane bonding. The refractive index n as well as the absorption index k were calculated and showed an independent of the film thickness in the film thicknesses range 400-770 nm. The refractive index n showed an anomalous dispersion in the absorption region as well as normal dispersion in the transparent region. Some of the important optical absorption such as the molar extinction coefficient, the oscillator strength, the electric dipole strength have been evaluated. The analysis of the spectral behavior of the absorption coefficient alpha in the absorption region revealed two indirect allowed transitions with corresponding energies 2.77 +/- 0.03 and 1.66 +/- 0.02eV. An energy band diagram has been proposed to account for the optical transitions of NiPc thin film. All previous parameters were as well obtained for films annealed at 523 K for 2 h. Discussion of the obtained results and their comparison with the previously published data are also given. (c) 2004 Elsevier Ltd. All rights reserved.
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