4.7 Article

Characterization of lithographically printed resistive strain gauges

期刊

IEEE SENSORS JOURNAL
卷 5, 期 5, 页码 864-871

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSEN.2005.845209

关键词

conductive lithographic film (CLF); offset lithography; printed sensors; printed strain gauges

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This paper reports progress in sensor fabrication by the conductive lithographic film (CLF) printing process. Work describing strain-sensitive structures manufactured using a modified printing process and conductive inks is addressed. The performance of a single-ink strain-sensitive structure when printed on six alternative substrates (GlossArt, PolyArt, Teslin, Mylar C, Melinex, and Kapton) is analyzed. Though not intending to compete with conventional gauges in high-tolerance measurement, the structures exhibit properties that indicate suitability for novel applications.

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