期刊
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK
卷 36, 期 10, 页码 552-556出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/mawe.200500923
关键词
TEM; spot patterns; electron diffraction; pattern recognition
The development of an automated crystal orientation mapping tool attached to a transmission electron microscope is described. The electron beam displacement is controlled by a remote computer while thousands of diffraction patterns are recorded with an external CCD camera and analysed with a dedicated software. The work being mainly concerned with severely deformed metals, spot patterns rather that Kikuchi lines are considered in this approach. The capabilities and the sensitivity of template matching techniques for orientation identification are stressed. To precisely locate the scanned area on TEM pictures, a pseudo-bright field image reconstruction procedure is proposed. A simple procedure to eliminate some orientation ambiguities is described.
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