4.5 Article Proceedings Paper

High mobility ZnO thin film deposition on SrTiO3 and transparent field effect transistor fabrication

期刊

SUPERLATTICES AND MICROSTRUCTURES
卷 38, 期 4-6, 页码 446-454

出版社

ACADEMIC PRESS LTD- ELSEVIER SCIENCE LTD
DOI: 10.1016/j.spmi.2005.08.016

关键词

-

向作者/读者索取更多资源

Zinc oxide and strontium titanate are among the most interesting materials for oxide electronics due to their semiconducting and dielectric properties respectively. We obtain high electron mobility values in epitaxial ZnO thin films deposited on (110) oriented strontium titanate substrates. Values up to 400 cm(2)/V s are found below 50 K in samples grown by a two step method: firstly a thin ZnO relaxing layer is deposited on the SrTiO3 (110) substrate at relatively low temperature (550 degrees C) and then the deposition temperature is raised up to 750 degrees C for the growth of a second ZnO layer. The realized epitaxial ZnO/SrTiO3 heterostructures are used to fabricate field effect transistors transparent at visible wavelength. By conventional photolithographic techniques we realize micrometric sized devices in planar side-gate configuration. The transistors have an 80% transmittance, on-off ratios up to 10(6), and field effect mobilities up to 30 cm(2)/V S. (C) 2005 Elsevier Ltd. All rights reserved.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.5
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据