4.7 Article

Optical and interferometric lithography - Nanotechnology enablers

期刊

PROCEEDINGS OF THE IEEE
卷 93, 期 10, 页码 1704-1721

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPROC.2005.853538

关键词

epitaxy; interference; lithography; metamaterials; nanofluidics; nanomagnetics; nanophotonics; nanoscience; nanotechnology; negative-index materials

向作者/读者索取更多资源

Interferometric lithography (IL), the interference of a small number of coherent optical beams, is a powerful technique for the fabrication of a wide array of samples of interest for nanoscience and nanotechnology. The techniques and limits of IL are discussed with particular attention to the smallest scales achievable. With immersion techniques, the smallest pattern size for a single exposure is a half-pitch of lambda/4n where lambda is the optical wavelength and n is the refractive index of the immersion material. Currently with a 193-nm excimer laser source and H2O immersion, this limiting dimension is similar to 34 nm. With nonlinear spatial frequency multiplication techniques, this limit is extended by factors of 112, 1/3, etc.-extending well into the nanoscale regime. IL provides an inexpensive, large-area capability as a result of its parallelism. Multiple exposures, multiple beams, and mix-and-match with other lithographies extend the range of applicability. Imaging IL provides an approach to arbitrary structures with comparable resolution. Numerous application areas, including nanoscale epitaxial growth for semiconductor heterostructures; nanofluidics for biological separations; nanomagnetics for increased storage density; nanophotonics including distributed feedback and distributed Bragg reflectors, two- and three-dimensional photonic crystals, metamaterials, and negative refractive index materials for enhanced optical interactions are briefly reviewed.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.7
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据