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Wavelength and line width measurement of optical sources with femtometre resolution

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ELECTRONICS LETTERS
卷 41, 期 22, 页码 1234-1235

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IEE-INST ELEC ENG
DOI: 10.1049/el:20053204

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A new and very simple method for the wavelength and line width measurement of optical sources with a resolution in the femtometre range is presented. Our method is based on the amplification of a backscattered wave by a pump wave due to Brillouin scattering. It requires neither a fast photodiode nor a spectrum analyser of any kind.

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