期刊
INTERNATIONAL JOURNAL OF THERMOPHYSICS
卷 26, 期 6, 页码 1833-1848出版社
SPRINGER/PLENUM PUBLISHERS
DOI: 10.1007/s10765-005-8599-y
关键词
inverse problems; nondestructive evaluation; photothermal techniques; thermal conductivity; thermal effusivity
Photothermal depth profiling is usually applied to inhomogeneous materials to localize the optical inhomogeneity or retrieve the thermal effusivity depth profile by simply monitoring the photothermal signal after the pump beam excitation. In this paper the different kinds of inverse problems related to photothermal depth profiling are discussed, and the solutions given by thermal wave backscattering (TWBS) and genetic algorithms (GAs) are compared. Finally, the different performances and limits of validity on known linear profiles are compared.
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