期刊
MATERIALS LETTERS
卷 59, 期 27, 页码 3406-3409出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2005.05.077
关键词
XRD; TEM; Ni; microstructure; mechanical property; high-pressure torsion
X-ray diffraction line broadening, TEM and microhardness investigations were carried out on Ni samples produced by the high-pressure torsion (HPT) technique. Distribution of grain size, microstrain (dislocation density) along the radial direction of the as-pressed Ni disk were quantified. Gradient in microhardness from the center to the edge of the deformed Ni disk is rationalized in terms of the grain size, dislocation density and grain boundaries at the corresponding region. (C) 2005 Elsevier B.V. All rights reserved.
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