期刊
SURFACE SCIENCE SPECTRA
卷 12, 期 1, 页码 149-153出版社
AMER INST PHYSICS
DOI: 10.1116/11.20051106
关键词
x-ray photoelectron spectroscopy; XPS; surface; polymer; poly(ether ether ketone); PEEK
XPS measurements of poly (ether ether ketone) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of carbon and oxygen peaks are analyzed. This is part of a contract work aiming to record spectra in the very same conditions of some 40 different polymers. (C) 2006 American Vacuum Society.
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