3.8 Article

Poly(ether ether ketone) (PEEK) XPS Reference Core Level and Energy Loss Spectra

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SURFACE SCIENCE SPECTRA
卷 12, 期 1, 页码 149-153

出版社

AMER INST PHYSICS
DOI: 10.1116/11.20051106

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x-ray photoelectron spectroscopy; XPS; surface; polymer; poly(ether ether ketone); PEEK

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XPS measurements of poly (ether ether ketone) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of carbon and oxygen peaks are analyzed. This is part of a contract work aiming to record spectra in the very same conditions of some 40 different polymers. (C) 2006 American Vacuum Society.

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