期刊
IEEE JOURNAL OF SOLID-STATE CIRCUITS
卷 40, 期 12, 页码 2805-2815出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2005.858476
关键词
dynamic element matching; offset cancellation; sigma-delta conversion; smart sensors; temperature sensors
A smart temperature sensor in 0.7 mu m CMOS is accurate to within +/- 0.1 degrees C (3 sigma) over the full military temperature range of -55 degrees C to 125 degrees C. The sensor uses substrate PNP transistors to measure temperature. Errors resulting from nonidealities in the readout circuitry are reduced to the 0.01 degrees C level. This is achieved by using dynamic element matching, a chopped current-gain independent PTAT bias circuit, and a low-offset second-order sigma-delta ADC that combines chopping and correlated double sampling. Spread of the base-emitter voltage characteristics of the substrate PNP transistors is compensated by trimming, based on a calibration at one temperature. A high trimming resolution is obtained by using a sigma-delta current DAC to fine-tune the bias current of the bipolar transistors.
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