Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles

Curve fitting of extended x-ray absorption fine structure (EXAFS) spectra, transmission electron microscopy (TEM) imaging, and Scherrer analysis of x-ray diffraction (XRD) are compared as methods for determining the mean crystallite size in polydisperse samples of platinum nanoparticles. By applying the techniques to mixtures of pure samples, it is found that EXAFS correctly determines the relative mean sizes of these polydisperse samples, while XRD tends to be weighted more toward the largest crystallites in the sample. Results for TEM are not clear cut, due to polycrystallinity and aggregation, but are consistent with the other results. (c) 2005 American Institute of Physics.