期刊
PHYSICAL REVIEW LETTERS
卷 95, 期 24, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.95.247005
关键词
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We report the thickness-dependent (in terms of atomic layers) oscillation behavior of the perpendicular upper critical field H-c2 perpendicular to in the ultrathin lead films at the reduced temperature (t=T/T-c). Distinct oscillations of the normal-state resistivity as a function of film thickness have also been observed. Compared with the T-c oscillation, the H-c2 perpendicular to shows a considerable large oscillation amplitude and a pi phase shift. The oscillatory mean free path caused by the quantum size effect plays a role in H-c2 perpendicular to oscillation.
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