The dependence of lattice strain in Al-N codoped p-type ZnO films on Al content and growth temperature was investigated. With increasing Al content, the compressive strain in the film first increases and then decreases. We suggest that the strain decrease is due to the occupation of more substitutional sites by Al at relatively high Al content, which partially compensates the compressive strain. Reversion of conduction type at high Al content and high temperature was also observed. By studying the strain and electrical properties of the codoped films, we conclude that ZnO film should be grown at intermediate temperatures and with low Al content to achieve both good p-type conduction and reasonable crystal quality. The compressive strain results in increase of the optical band gap, and a linear relationship between them was obtained. (c) 2006 American Institute of Physics.
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