We propose and demonstrate a scheme for two-dimensional terahertz reflection imaging using a time-domain phase-retrieval algorithm based on the dispersion relations of complex reflection coefficients. With this scheme, topographic images-as well as the dielectric functions of a structured sample-can be obtained. A composite sample made of a semiconductor and metals is characterized within depth and lateral errors of 50 mu m and 100 mu m. (c) 2006 American Institute of Physics.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据