期刊
SCRIPTA MATERIALIA
卷 54, 期 3, 页码 333-336出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2005.09.052
关键词
amorphous metallic glass; high-resolution electron microscopy; crystallization; shear bands; nanovoids
Transmission electron microscopy (TEM) studies on mechanically-induced nanocrystallization in amorphous alloys are reviewed briefly. Using a recently-developed, quantitative, high-resolution TEM method, defects in deformed, Al-based, amorphous, alloys were observed and related to mechanically-induced nanocrystallization. Deformation-assisted atomic transport and the resulting nanocrystallization are discussed. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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