期刊
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
卷 45, 期 4-7, 页码 L187-L189出版社
JAPAN SOC APPLIED PHYSICS
DOI: 10.1143/JJAP.45.L187
关键词
BiFeO3; multiferroic; ferroelectric; critical thickness; piezoelectric force microscope
We report here on the preservation of ferroelectricity down to 2 nm in BiFeO3 ultrathin films. The electric polarization can be switched reversibly and is stable over several days. Our findings bring insight on the fundamental problem of ferroelectricity at low thickness and confirm the potential of BiFeO3 as a lead-free ferroelectric and multiferroic material for nanoscale devices.
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