期刊
SCRIPTA MATERIALIA
卷 54, 期 6, 页码 1059-1063出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2005.11.060
关键词
grain boundary energy; grain growth; Al; thin films; tilt boundaries
Relative free energies of (111) tilt boundaries in 1.7-mu m-thick A1 films were compared with boundary enthalpies obtained via molecular dynamics simulations. Grain growth studies in 25 and 100-nm-thick A1 films were compared with simulations. The sources of the differences between experimental and simulational results are discussed. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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