期刊
SURFACE SCIENCE
卷 600, 期 5, 页码 1099-1106出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.susc.2005.12.038
关键词
epitaxial thin films; growth; oxide nanolayer; nickel oxides; palladium (100); scanning tunneling microscopy (STM); high-resolution LEED (HR-LEED, SPA-LEED); morphology
The surface morphology and the lattice constants of NiO overlayers in the thickness range of 1-20 monolayers (NiO nanolayers) on Pd(100) have been investigated by high-resolution spot profile low-energy electron diffraction (SPA-LEED) and scanning tunneling microscopy (STM). NiO islands grow epitaxially on Pd(100) on top of a c(4 x 2) Ni3O4 monolayer with a compressed strained lattice, which relaxes gradually attaining the bulk lattice constant at 10-12 monolayers. The strain relaxation is accompanied by the formation of small angle mosaic defect regions at the surface, which have been characterised quantitatively by following the behaviour of the satellites to the main Bragg diffraction rods. The analysis of the diffuse scattering intensity around the (00) diffraction spot reveals anisotropic NiO island shapes, whose orientation depends oil the growth conditions. An incommensurate superlattice in LEED and STM at intermediate NiO coverages (similar to 2-6 monolayers) is observed and its origin is discussed. (c) 2006 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据