期刊
IEEE TRANSACTIONS ON NANOTECHNOLOGY
卷 5, 期 2, 页码 77-79出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNANO.2005.858592
关键词
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A compact dual-tip scanning tunneling microscope (STM) design that achieves both rigidity and stability is presented. We constructed a prototype unit to perform tests in ambient conditions. The two STM tips were able to maintain a stable tunneling condition with the sample surface simultaneously. Topographic images of a fresh cleaved graphite were taken simultaneously from the two tips. A common feature found in both images indicates that the two tunneling spots are similar to 800 nm apart.
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