期刊
CHEMPHYSCHEM
卷 7, 期 3, 页码 704-709出版社
WILEY-V C H VERLAG GMBH
DOI: 10.1002/cphc.200500557
关键词
atomic force microscopy; cobalt; cyclic voltammetry; nanostructures; surface chemistry
In situ atomic force microscopy (AFM) is used to study the growth of cobalt nuclei on a boron doped diamond electrode under potentiostatic control. The rate of growth of the nuclei at the electrode surface is monitored using AFM as a function of time at different deposition potentials. The nucleation of cobalt nuclei is found to be instantaneous and the growth of the nuclei is shown to be kinetically rather than diffusionally controlled over periods of tens and hundreds of seconds. At very short times I(< 70 seconds) the kinetics of nucleation are apparent.
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