期刊
出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2005.12.024
关键词
Ge-76; neutrinoless double-beta decay; Ge detectors; pulse shape analysis; segmentation
The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits. (c) 2005 Elsevier B. V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据