期刊
JOURNAL OF CRYSTAL GROWTH
卷 289, 期 1, 页码 113-120出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jcrysgro.2005.10.105
关键词
growth monitoring; phase transformation; XRD; thin film; chalcopyrite; solar cell
Phase transformations of CuxIn thin films were investigated in annealing experiments using real-time in situ energy dispersive X-ray diffraction (EDXRD). CuxIn films of micrometer thickness with x = 0.7, 1.0, and 1.8 were annealed up to 500 degrees C. The experiments were designed in order to form a basis for the understanding of the phase transformations relevant for chalcogenization of CuxIn films. The starting layers for the in situ study consist of CuIn2 and Cu, i.e. all In are accumulated in an intermetallic phase. Depending on the In content in a film, the volume fraction of the CuIn2 phase varies. The main phase transformations in the annealing cycle can be described by the following reaction schemes: (1) 11CuIn(2) -> Cu11In9 + 13In(solid), (2) 16Cu(solid) + 9In(liq) ->eta-Cu16In9 (or (2') 7Cu(solid) + 9In(liq) -> Cu7In3), and (3) 16Cu(11)In(9) -> 11 eta-Cu16In9 + 45In(liq). At top temperature, rapidly changing diffraction patterns point out rapid transitions between different metastable. polytypes of Cu16In9. Metallic phases observed at room temperature after quenching are eta-Cu16In9, Cu11In9, and In-solid where the respective volume fractions depend on the starting film composition. (c) 2005 Elsevier B.V. All rights reserved.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据