期刊
PHYSICAL REVIEW LETTERS
卷 96, 期 11, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.96.117404
关键词
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The resonant inelastic x-ray scattering (RIXS) cross section at the L and M edges of transition-metal compounds is studied using an effective scattering operator. The intensities of the elastic peak and for spin-flip processes are derived. It is shown how the polarization dependence can be used to select transitions. Comparisons are made with experiment. A detailed analysis of the polarization and angular dependence of L- and M-edge RIXS for divalent copper compounds, such as the high-T-c superconductors, is given.
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