期刊
JOURNAL OF ELECTRONIC MATERIALS
卷 35, 期 4, 页码 663-669出版社
SPRINGER
DOI: 10.1007/s11664-006-0117-x
关键词
ZnO; bulk crystals; electron traps
Undoped bulk: ZnO crystals obtained from Tokyo Denpa show either resistive behavior [(5 X 10(4))-(3 X 10(5)) Ohm cm) or low n-type conductivity (n similar or equal to 10(14) cm(-3)) with mobilities in the latter case of 130-150 cm(2)/V sec. The variation in resistivity may be related to the thermal instability of Li that is present in the samples. The Fermi level is pinned by 90-meV shallow donors that are deeper than the 70 meV and hydrogen-related 35-meV shallow donors in Eagle Pitcher and Cermet substrates. In all three cases, 0.3-eV electron traps are very prominent, and in the Tokyo Denpa material they dominate the high-temperature capacitance-frequency characteristics. The concentration of these traps, on the order of 2 X 10(15) cm(-3), is about 20 times higher in the Tokyo Denpa ZnO compared to the two other materials. The other electron traps at E-c -0.2 eV commonly observed in undoped n-ZnO are not detected in conducting Tokyo Denpa ZnO samples, but they may be traps that pin the Fermi level in the more compensated high-resistivity samples.
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