Resonant inelastic hard x-ray scattering with diced analyzer crystals and position-sensitive detectors

A novel design of a high-resolution spectrometer is proposed for emission spectroscopy and resonant inelastic hard x-ray scattering applications. The spectrometer is based on a Rowland circle geometry with a diced analyzer crystal and a position-sensitive detector. The individual flat crystallites of the diced analyzer introduce a well-defined linear position-energy relationship within the analyzer focus. This effect can be exploited to measure emission spectra with an unprecedented resolution. For demonstration, a spectrometer was constructed using a diced Si(553) analyzer working at the Cu K edge with an intrinsic resolution of 60 meV. With the proposed design, spectrometers operating at the K edges of 3d transition metals can have intrinsic resolutions below 100 meV even with analyzer crystals not working in Bragg-backscattering conditions. (c) American Institute of Physics.